Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11448869 | Wafer | Toshimitsu Kawai, Katsumi Shibayama, Takashi Kasahara, Masaki Hirose, Hiroki Oyama | 2022-09-20 |
| 11422059 | Optical inspection device and optical inspection method | Takashi Kasahara, Katsumi Shibayama, Masaki Hirose, Toshimitsu Kawai, Hiroki Oyama | 2022-08-23 |
| 11294170 | Method for removing foreign matter and method for manufacturing optical detection device | Masaki Hirose, Katsumi Shibayama, Takashi Kasahara, Toshimitsu Kawai, Hiroki Oyama | 2022-04-05 |