Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11301987 | Determining locations of suspected defects | Ofir Greenberg, Dan Segal, Dae Hwan Youn | 2022-04-12 |
| 11232550 | Generating a training set usable for examination of a semiconductor specimen | Elad Ben Baruch, Shalom Elkayam, Shaul Cohen | 2022-01-25 |