Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11500009 | Testing apparatus, testing method, and manufacturing method | — | 2022-11-15 |
| 11264495 | Semiconductor device using regions between pads | — | 2022-03-01 |
| 11239234 | Semiconductor device | Tomoyuki Obata, Soichi YOSHIDA, Seiji Momota | 2022-02-01 |