Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11519871 | Method of examining a sample using a charged particle microscope | Jan Klusá{hacek over (c)}ek, Ji{hacek over (r)}í Pet{hacek over (r)}ek | 2022-12-06 |
| 11327032 | Method of examining a sample using a charged particle microscope | Jan Klusá{hacek over (c)}ek | 2022-05-10 |