Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11495431 | Transmission electron microscope and adjustment method of objective aperture | — | 2022-11-08 |
| 11495432 | Charged particle beam device and method for controlling sample stage | Daichi Maekawa | 2022-11-08 |