HW

Hsun-Tai Wei

CC Chunghwa Precision Test Tech. Co.: 2 patents #4 of 9Top 45%
Overall (2022): #153,508 of 548,613Top 30%
2
Patents 2022

Issued Patents 2022

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
11287446 Split thin-film probe card Wen-Tsung Lee, Kai-Chieh Hsieh, Chao Liu 2022-03-29
11226354 Probe card device and fence-like probe thereof Wen-Tsung Lee, Kai-Chieh Hsieh, Wei-Jhih Su 2022-01-18