Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11391682 | Auger electron microscope and analysis method | Tatsuya Uchida | 2022-07-19 |
| 11315753 | Charged particle beam device and analysis method | Tatsuya Uchida | 2022-04-26 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11391682 | Auger electron microscope and analysis method | Tatsuya Uchida | 2022-07-19 |
| 11315753 | Charged particle beam device and analysis method | Tatsuya Uchida | 2022-04-26 |