JX

Jing XU

NC National Institute Of Metrology, China: 1 patents #1 of 5Top 20%
Overall (2022): #402,316 of 548,613Top 75%
1
Patents 2022

Issued Patents 2022

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11268978 Tip-enhanced Raman spectroscope system Zhen-Dong Zhu, Si Gao, Wei Li, Shi-Gang Li 2022-03-08