Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11436506 | Method and devices for determining metrology sites | Abhilash Srikantha, Keumsil Lee, Thomas Korb, Jens Timo Neumann, Eugen Foca | 2022-09-06 |
| 11226481 | Methods and apparatuses for designing optical systems using machine learning with delano diagrams | Toufic Jabbour, Christoph Menke, Markus Schwab | 2022-01-18 |