Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11371831 | Method for determining the thickness and refractive index of a layer using a shape feature during analysis | Nils Langholz | 2022-06-28 |
| 11327288 | Method for generating an overview image using a large aperture objective | Jörg Siebenmorgen, Helge Eggert, Martin Beck | 2022-05-10 |
| 11314068 | Illumination apparatus for a microscope, method for operating it, and microscope having an illumination apparatus | Thomas Kalkbrenner, Jörg Siebenmorgen, Andreas Möbius | 2022-04-26 |