Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11513819 | Machine learning based impact analysis in a next-release quality assurance environment | Sandeep Verma, Pavan Chayanam, Srinivas Dundigalla | 2022-11-29 |
| 11232019 | Machine learning based test coverage in a production environment | Sandeep Verma, Pavan Chayanam, Srinivas Dundigalla | 2022-01-25 |