Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11287253 | Device and method applicable for measuring ultrathin thickness of film on substrate | Han-Yu CHANG, Bo He, Guo-Dung Chen, Wen-Li Wu, Wei-En Fu | 2022-03-29 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11287253 | Device and method applicable for measuring ultrathin thickness of film on substrate | Han-Yu CHANG, Bo He, Guo-Dung Chen, Wen-Li Wu, Wei-En Fu | 2022-03-29 |