Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11372343 | Alignment method and associated metrology device | Johannes Hubertus Antonius Van De Rijdt, Marcel Pieter Jacobus Peeters, Chien-Hung Tseng, Henricus Petrus Maria Pellemans | 2022-06-28 |
| 11315752 | E-beam apparatus | Peter Paul HEMPENIUS, Sven Antoin Johan Hol, Maarten Frans Janus Kremers, Niels Johannes Maria Bosch, Marcel Koenraad Marie Baggen | 2022-04-26 |
| 11302512 | Electron beam inspection apparatus stage positioning | Marcel Koenraad Marie Baggen, Antonius Henricus Arends, Lucas KUINDERSMA, Johannes Hubertus Antonius Van De Rijdt, Peter Paul HEMPENIUS +5 more | 2022-04-12 |