Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11385188 | System and method for defect detection using multi-spot scanning | Amir Shoham, Yoav Berlatzky | 2022-07-12 |
| 11270432 | Inspection of a three dimensional structure of a sample using a phase shift mask | Yoav Shechtman | 2022-03-08 |