Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11487848 | Process abnormality identification using measurement violation analysis | Selim Nahas, Joseph James Dox, Vishali Ragam, Eric J. Warren, Shijing Wang +2 more | 2022-11-01 |