Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11525777 | Optimizing signal-to-noise ratio in optical imaging of defects on unpatterned wafers | Yechiel Kapoano, David Goldovsky | 2022-12-13 |
| 11474437 | Increasing signal-to-noise ratio in optical imaging of defects on unpatterned wafers | Yechiel Kapoano, David Goldovsky | 2022-10-18 |