Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11366150 | Probe for non-intrusively detecting imperfections in a test object | Sebastien Bernier, John Enderby, Mark Bowes, Dawood Parker | 2022-06-21 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11366150 | Probe for non-intrusively detecting imperfections in a test object | Sebastien Bernier, John Enderby, Mark Bowes, Dawood Parker | 2022-06-21 |