Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11428645 | Wafer inspection device and method of manufacturing semiconductor device by using the wafer inspection device | Sungyoon Ryu, Kwangeun Kim, Hwiwoo Park, Dayoung Yoon, Myoungkyu Choi | 2022-08-30 |