Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11079419 | System for testing Nakagami fading channel and verification method thereof | Yigang He, Yuan Huang, Hui Zhang, Bing Li, Jiajun Duan | 2021-08-03 |
| 11002789 | Analog circuit fault feature extraction method based on parameter random distribution neighbor embedding winner-take-all method | Yigang He, Wei He, Hui Zhang, Liulu HE, Bing Li | 2021-05-11 |