MB

Markus Bartscher

2
Patents 2021

Issued Patents 2021

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
11047810 Method for monitoring the functional state of a system for computer-tomographic examination of workpieces Torsten Schönfeld, Thomas Günther, Christoph Poliwoda, Christof Reinhart 2021-06-29
10983072 Method for dimensional x-ray measurement, in particular by computed tomography, and x-ray computed tomography scanner Jens Illemann 2021-04-20