Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11017259 | Defect inspection method, defect inspection device and defect inspection system | Arulmurugan Ambikapathi, Chia-Liang Lu, Chih-Heng Fang | 2021-05-25 |
| 10991088 | Defect inspection system and method using artificial intelligence | Arulmurugan Ambikapathi, Chia-Liang Lu, Chih-Heng Fang | 2021-04-27 |
| 10964004 | Automated optical inspection method using deep learning and apparatus, computer program for performing the method, computer-readable storage medium storing the computer program, and deep learning system thereof | Chih-Heng Fang, Chia-Liang Lu, Arulmurugan Ambikapathi, Chien-Chung Lin | 2021-03-30 |