Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11037287 | Method for measuring critical dimension and image-processing apparatus for measuring critical dimension | Ching-Ya Huang | 2021-06-15 |
| 10916006 | Recognition method of pattern feature | Ching-Ya Huang | 2021-02-09 |