Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11125803 | Method of measuring semiconductor device by applying voltage to the semiconductor device using probe needle | Shozo Shikama, Yoichiro Tarui | 2021-09-21 |
| 10916666 | Semiconductor device | — | 2021-02-09 |