Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11088138 | Semiconductor device for testing characteristics of transistors and method for testing semiconductor device | Hideok Lee, Dongjun Oh, Sungkyu Kwon, Soyeong Kim | 2021-08-10 |