Issued Patents 2021
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11211271 | Systems and methods for semiconductor structure sample preparation and analysis | Shih-Wei Hung | 2021-12-28 |
| 11087956 | Detection systems in semiconductor metrology tools | Shih-Wei Hung | 2021-08-10 |
| 11088036 | Atom probe tomography specimen preparation | Shih-Wei Hung | 2021-08-10 |
| 11079405 | Method and apparatus for detecting ferroelectric signal | Wei-Shan Hu, Dong Gui | 2021-08-03 |