Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11105848 | Probe card with angled probe and wafer testing method using the same | Yuan-Chun Wu, Ni SHEN | 2021-08-31 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11105848 | Probe card with angled probe and wafer testing method using the same | Yuan-Chun Wu, Ni SHEN | 2021-08-31 |