Issued Patents 2021
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11209462 | Testing apparatus | Hsiao Ting Tseng, Li Min Wang, Chia Hao Tu, Chun-Wei Peng | 2021-12-28 |
| 11054465 | Method of operating a probing apparatus | Yi Ming Lau | 2021-07-06 |
| 11047880 | Probing device | Ho Yeh Chen | 2021-06-29 |
| 10890614 | Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under test | Yi Ming Lau | 2021-01-12 |