Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11027977 | Method of manufacturing tantalum carbide material | — | 2021-06-08 |
| 10978359 | SiC substrate evaluation method, SiC epitaxial wafer manufacturing method, and SiC epitaxial wafer | — | 2021-04-13 |
| 10900888 | Method for evaluating tantalum carbide | Nobuyuki Oya | 2021-01-26 |