Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11193887 | Defect detection method and device | Takahide HATAHORI | 2021-12-07 |
| 11181510 | Inspection apparatus and inspection method | Takahide HATAHORI, Koki YOSHIDA | 2021-11-23 |
| 10942152 | Defect inspection device and method | Takahide HATAHORI, Yuya Nagata | 2021-03-09 |