Issued Patents 2021
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11131637 | Analysis method for fine structure, apparatus, and program | Yoshiyasu Ito | 2021-09-28 |
| 11079345 | X-ray inspection device | Naoki Matsushima, Kiyoshi Ogata, Sei Yoshihara, Yoshiyasu Ito, Hiroshi Motono +6 more | 2021-08-03 |
| 10983073 | Hybrid inspection system | Kiyoshi Ogata, Yoshiyasu Ito | 2021-04-20 |
| 10964439 | Soller slit, X-ray diffraction apparatus, and method | Ladislav Pina, Adolf Inneman, Shintaro Kobayashi | 2021-03-30 |