| 11107804 |
IC with test structures and e-beam pads embedded within a contiguous standard cell area |
Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli +21 more |
2021-08-31 |
| 11081476 |
IC with test structures and e-beam pads embedded within a contiguous standard cell area |
Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli +21 more |
2021-08-03 |
| 11081477 |
IC with test structures and e-beam pads embedded within a contiguous standard cell area |
Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli +21 more |
2021-08-03 |
| 11075194 |
IC with test structures and E-beam pads embedded within a contiguous standard cell area |
Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli +21 more |
2021-07-27 |
| 11018126 |
IC with test structures and e-beam pads embedded within a contiguous standard cell area |
Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli +21 more |
2021-05-25 |
| 10978438 |
IC with test structures and E-beam pads embedded within a contiguous standard cell area |
Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli +21 more |
2021-04-13 |