Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11187722 | Probe pin and electronic device using the same | Hirotada Teranishi, Makoto Kondo, Naoyuki Kimura | 2021-11-30 |
| 10962564 | Probe pin, inspection jig, inspection unit and inspection device | Naoya Sasano, Hirotada Teranishi, Si-Hun Choi | 2021-03-30 |
| 10928420 | Probe pin and inspection unit | Hirotada Teranishi | 2021-02-23 |