Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11211270 | Pattern inspection method and pattern inspection apparatus | — | 2021-12-28 |
| 11062172 | Inspection apparatus and inspection method | Eiji Matsumoto | 2021-07-13 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11211270 | Pattern inspection method and pattern inspection apparatus | — | 2021-12-28 |
| 11062172 | Inspection apparatus and inspection method | Eiji Matsumoto | 2021-07-13 |