Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11137437 | Probe device, electrical inspection apparatus, and electrical inspection method | Fumihiko Matsuda, Yoshihiko Narisawa | 2021-10-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11137437 | Probe device, electrical inspection apparatus, and electrical inspection method | Fumihiko Matsuda, Yoshihiko Narisawa | 2021-10-05 |