Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11009523 | Probe, inspection jig, and inspection apparatus | Tadakazu Miyatake, Akio Hayashi, Masaki NAGANUMA, Matthias Joseph Chin Chieh Chia, Cheng Ghee Ong +1 more | 2021-05-18 |