KF

Kenichiro Fujiyama

NE Nec: 1 patents #351 of 925Top 40%
Overall (2021): #378,087 of 548,734Top 70%
1
Patents 2021

Issued Patents 2021

Patent #TitleCo-InventorsDate
11156476 Abnormality determination device, abnormality determination method, and non-transitory recording medium Tetsuri ARIYAMA, Tan AZUMA, Soichiro Araki, Mineto SATOH 2021-10-26