YL

Yun Lu

NM National Institute Of Metrology: 1 patents #1 of 10Top 10%
Overall (2021): #194,094 of 548,734Top 40%
1
Patents 2021

Issued Patents 2021

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10907950 Laser heterodyne interferometric apparatus and method based on plane mirror reflection Yang Bai, Zheng Kun Li, Zhong-Hua Zhang, Qing He 2021-02-02