Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11131699 | Method for determining probe angle, high-frequency test system, program and storage medium | Masahiro Horibe | 2021-09-28 |
| 11092651 | High-frequency probe position correction technology | — | 2021-08-17 |
| 10944146 | Dielectric waveguide having a dielectric waveguide body and a dielectric waveguide end with specified densities and method of producing | Hiroyuki Yoshimoto, Dai Fukami, Taku Yamanaka, Masahiro Horibe, Yuto Kato | 2021-03-09 |