Issued Patents 2021
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11205495 | Read disturb mitigation based on signal and noise characteristics of memory cells collected for read calibration | Patrick R. Khayat, James Fitzpatrick, AbdelHakim S. Alhussien | 2021-12-21 |
| 11200959 | Optimization of soft bit windows based on signal and noise characteristics of memory cells | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2021-12-14 |
| 11177013 | Determine signal and noise characteristics centered at an optimized read voltage | Patrick R. Khayat, James Fitzpatrick | 2021-11-16 |
| 11170847 | Determining soft data for fractional digit memory cells | Patrick R. Khayat, Mustafa N. Kaynak | 2021-11-09 |
| 11163488 | Extended cross-temperature handling in a memory sub-system | Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Mustafa N. Kaynak, Kishore Kumar Muchherla, Shane Nowell +2 more | 2021-11-02 |
| 11152073 | Iterative read calibration enhanced according to patterns of shifts in read voltages | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2021-10-19 |
| 11146291 | Configuring iterative error correction parameters using criteria from previous iterations | Eyal En Gad, Zhengang Chen, Yoav Weinberg | 2021-10-12 |
| 11132037 | Operating temperature management of a memory sub-system | Shane Nowell | 2021-09-28 |
| 11133083 | Read model of memory cells using information generated during read operations | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2021-09-28 |
| 11131705 | Allocation of test resources to perform a test of memory components | Aswin Thiruvengadam, Frederick Jensen | 2021-09-28 |
| 11101015 | Multi-dimensional usage space testing of memory components | Aswin Thiruvengadam, Preston A. Thomson | 2021-08-24 |
| 11086572 | Self adapting iterative read calibration to retrieve data from memory cells | AbdelHakim S. Alhussien, James Fitzpatrick, Patrick R. Khayat | 2021-08-10 |
| 11081200 | Intelligent proactive responses to operations to read data from memory cells | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2021-08-03 |
| 11068186 | Providing recovered data to a new memory cell at a memory sub-system based on an unsuccessful error correction operation | Sampath K. Ratnam, Vamsi Pavan Rayaprolu, Mustafa N. Kaynak, Kishore Kumar Muchherla, Shane Nowell +2 more | 2021-07-20 |
| 11049582 | Detection of an incorrectly located read voltage | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2021-06-29 |
| 11043269 | Performing a test of memory components with fault tolerance | Aswin Thiruvengadam, Daniel G. Scobee | 2021-06-22 |
| 11029890 | Compound feature generation in classification of error rate of data retrieved from memory cells | James Fitzpatrick, Patrick R. Khayat, AbdelHakim S. Alhussien | 2021-06-08 |
| 11024401 | Compute an optimized read voltage | Patrick R. Khayat, James Fitzpatrick, AbdelHakim S. Alhussien | 2021-06-01 |
| 10998923 | Stopping criteria for layered iterative error correction | Mustafa N. Kaynak, William H. Radke, Patrick R. Khayat | 2021-05-04 |
| 10963340 | Storing critical data at a memory system | Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Peter Feeley, Kishore Kumar Muchherla | 2021-03-30 |
| 10936416 | Redundant array of independent NAND for a three-dimensional memory array | Jung Sheng Hoei, Sampath K. Ratnam, Renato C. Padilla, Kishore Kumar Muchherla, Peter Feeley | 2021-03-02 |
| 10929474 | Proactive corrective actions in memory based on a probabilistic data structure | Saeed Sharifi Tehrani | 2021-02-23 |
| 10910081 | Management of test resources to perform reliability testing of memory components | Aswin Thiruvengadam, Daniel G. Scobee, Frederick Jensen | 2021-02-02 |
| 10903860 | Error correction code (ECC) operations in memory for providing redundant error correction | Patrick R. Khayat, Mustafa N. Kaynak | 2021-01-26 |
| 10891191 | Apparatuses and methods for generating probabilistic information with current integration sensing | Patrick R. Khayat, Mustafa N. Kaynak, Mark A. Helm, Aaron Yip | 2021-01-12 |