PK

Pieter Kruit

TD Technische Universiteit Delft: 1 patents #1 of 24Top 5%
Overall (2021): #300,494 of 548,734Top 55%
1
Patents 2021

Issued Patents 2021

Patent #TitleCo-InventorsDate
10903042 Apparatus and method for inspecting a sample using a plurality of charged particle beams Aernout Christiaan Zonnevylle, Yan Ren 2021-01-26