Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10923526 | Multi-pass imaging using image sensors with variably biased channel-stop contacts for identifying defects in a semiconductor die | Jehn-Huar Chem, Stephen Biellak | 2021-02-16 |
| 10903258 | Image sensors with grounded or otherwise biased channel-stop contacts | Jehn-Huar Chern, Stephen Biellak | 2021-01-26 |