Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11170332 | Data analysis system and apparatus for analyzing manufacturing defects based on key performance indicators | Hikaru Koyama, Toshihiro Kujirai | 2021-11-09 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11170332 | Data analysis system and apparatus for analyzing manufacturing defects based on key performance indicators | Hikaru Koyama, Toshihiro Kujirai | 2021-11-09 |