Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11164800 | Test structure, semiconductor device and method for obtaining fabricating information in semiconductor device | — | 2021-11-02 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11164800 | Test structure, semiconductor device and method for obtaining fabricating information in semiconductor device | — | 2021-11-02 |