Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11060859 | Methods and systems for thickness measurement of multi-layer structures | Daryoosh Saeedkia, Alexander William Strong | 2021-07-13 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11060859 | Methods and systems for thickness measurement of multi-layer structures | Daryoosh Saeedkia, Alexander William Strong | 2021-07-13 |