Issued Patents 2021
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11135654 | Method and system for monitoring additive manufacturing processes | Vivek R. Dave, R. Bruce Madigan, Martin S. Piltch | 2021-10-05 |
| 11072043 | Layer-based defect detection using normalized sensor data | Vivek R. Dave | 2021-07-27 |
| 11073431 | Optical manufacturing process sensing and status indication system | Vivek R. Dave, R. Bruce Madigan, Martin S. Piltch, Alberto Castro | 2021-07-27 |