Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11016145 | Fault test circuit using launch-off-shift scan | Ignacio Lesser, Nicolas Rigoni, Octavio H. Alpago | 2021-05-25 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11016145 | Fault test circuit using launch-off-shift scan | Ignacio Lesser, Nicolas Rigoni, Octavio H. Alpago | 2021-05-25 |