Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11067658 | Probe card inspection wafer, probe card inspection system, and method of inspecting probe card | Dany Kim, Han-jik Nam, Jin Woo Jung | 2021-07-20 |
JJ
Joon-Su Ji
Overall (2021): #397,325 of 548,734Top 75%
1
Patents 2021