Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11156637 | Electrical test probes having decoupled electrical and mechanical design | Roy E. Swart, Edin Sijercic | 2021-10-26 |
| 11156640 | MEMS probe card assembly having decoupled electrical and mechanical probe connections | Mukesh Selvaraj | 2021-10-26 |
| 11054443 | Probe tip with embedded skate | Chun-Chih Wang | 2021-07-06 |