Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11067658 | Probe card inspection wafer, probe card inspection system, and method of inspecting probe card | Joon-Su Ji, Dany Kim, Jin Woo Jung | 2021-07-20 |
HN
Han-jik Nam
Overall (2021): #439,536 of 548,734Top 85%
1
Patents 2021