Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11120969 | Method and system for charged particle microscopy with improved image beam stabilization and interrogation | Doug K. Masnaghetti, Gabor Toth, David Trease, Rohit Bothra, Rainer Knippelmeyer | 2021-09-14 |
| 10921262 | Correlating SEM and optical images for wafer noise nuisance identification | Qiang Zhang | 2021-02-16 |